Introduction to DRAM Testing-DRAM inside team-2015.MayAgendanBasis of TestingnTypical DRAM Testing FlownBurn-innDC Test(Open/Short,Leakage,IDD)nFunctional Test&Test PatternnSpeed TestDRAM ManufactureWaferAssemblyFinal TestingFinal ProductWhy Testing?To screen out defectWafer defectAssembly defectMake sure product meet spec of customerVoltage guard bandTemperature guard bandTiming guard bandComplex test patternCollect data for design&process improvementQualityReliabilityCostEfficiencyIC Test Meth
