.RELIABILITY TEST CONDITIONSWIRE WOUND CHIP INDUCTORS TYPEFOR SMD322522/453232 / SMTSDR322520/453226 / SMDCHGR0603/0805/1008/1210 / SMDFSR1008 / SMTSItem (项目)Required Characteristics (要求)Test Method/Condition (测试方法)High temperature Storage test Reference documents:MIL-STD-202G Method 108A高温储存试验 1.No case deformation or change in appearance.2.L/L10%3.Q/Q30%4.DCR/DCR10%1.无明显的外观缺陷2.感值变化不超过10%3.质量因子变化不超过30% 4.直流电阻变化不超过10% Temperature: 852 Time
