Introduction to DRAM Testing- DRAM inside team- 2015.MayAgendan Basis of Testingn Typical DRAM Testing Flown Burn-inn DC Test (Open/Short, Leakage, IDD)n Functional Test & Test Patternn Speed TestDRAM ManufactureWaferAssemblyFinal TestingFinal ProductWhy Testing? To screen out defect Wafer defect Assembly defect Make sure product meet spec of customer Voltage guard band Temperature guard band Timing guard band Complex test pattern Collect data for design & process improvement Quality Reliability
